IOL testing of discrete semiconductors
Supports IOL tests and power cycle tests for small discrete semiconductors!
We would like to introduce our "IOL testing of discrete semiconductors." Under normal temperature conditions, we repeatedly turn the power ON/OFF, applying stress to the device due to temperature changes caused by the device's own heat generation during operation. During the power OFF period (cooling), forced cooling is also performed using a fan. 【Adjustment Conditions】 ■ Temperature Rise: 125℃ ■ Heating Time: 5 minutes ■ Cooling Time: 5 minutes ■ Fan Operating Time: 2 minutes *For more details, please download the PDF or feel free to contact us.
- Company：アイテス
- Price：Other
